The profilometer PCE-RT 2000 is used for accurate measurement of surface roughness. The profilometer can be used on all surfaces. The roughness with the profilometer is precisely recorded via the piezo sensor. The profilometer measures in the ranges Ra, Rq, Rsm, Rsk, Rz, Rt, Rp, Rv, Rc and is therefore a universal profilometer in quality assurance.
The profilometer is simply placed on the surface for measurement. During the measurement process, a probe is pulled over the surface and the profilometer displays the measured value on the large, OLED display. In addition to the numerical measured value display, the measuring profile can be graphically visualized. The profilometer PCE-RT 2000 is powered by a rechargeable battery. The charger of the profilometer is included in delivery. The profilometer has an automatic shut-off function for the battery care.
The profilometer PCE-RT 2000 has a Micro USB cable. The measuring device can be charged via this connection. Furthermore, the measurement data can be transmitted from the profilometer to the software. So it is possible to create a complete documentation of the measurement.
Rz = Average roughness
The average roughness depth Rz is the arithmetic mean of the largest single-order depths of several adjacent individual measurement sections.
Ra = Arithmetic mean roughness
Ra is the generally recognized and internationally applied roughness parameter. It is the arithmetic mean of the absolute values of the profile deviations within the reference distance. The measured value Ra is always smaller than the Rz value determined on the same roughness profile.
Rt = Maximum roughness
The maximum surface roughness Rt is the distance between the highest and the lowest point of the measuring section.
Rq = Square Mean Roughness
Rq is the root mean square of all ordinate values within the individual measurement distance l. Rq corresponds to the designation RMS (Root Mean Square).
Measurement parameters | Ra, Rq, Rsm, Rsk, Rz, Rt, Rp, Rv, Rc |
Measuring ranges | Ra, Rq, Rc: 0.005 μm ... 16 μm Rz, Rt, Rp, Rv: 0.02 μm ... 200 μm Rsm: 5 μm ... 1000 μm Rsk: -1 ... 1 |
Radius stylus tip | 5 μm |
Material stylus tip | Diamond, 90° angled |
Max. Recommended force for static measurement | 4 mN (0.4 gf) |
Measuring principle | Inductive |
Radius longitudinal guide bar | 45 mm / 1.8 in |
Standards | ANSIB46.1/ASMEB46.1 (DIN EN ISO 4287) |
Maximum driving distance | 15 mm / 0.6 in |
Cut-off wavelength (cut off) | 0.135 mm / s at cut-off wavelength: 0.25 mm 0.5 mm / s at cut-off wavelength: 0.8 mm 1 mm / s at cut-off wavelength: 2.5 mm Reversing speed: 1 mm / s |
Measurement accuracy | <± 10% |
Repeatability | <6% |
Display | OLED |
Units | μm / μinch (switchable) |
Interface | Micro USB |
Power supply | Rechargeable Li-ion battery |